📝 Event: 2026-07-09_objective_turret_cleaning_and_recalibration

📊 Report Overview

Event Metadata

Record Type
Maintenance Event

Reason / Suite
Check

Service Provider
internal

Instrument
scope-testx1

Maintenance Action

Reason Details:
Weekly QC trend indicated slight channel-dependent focus offset after objective changes, suggesting turret contact contamination.

Action Details:
Cleaned turret electrical contacts and objective shoulders with approved solvent, then recalibrated parfocal offsets for 20x/40x/60x objectives.

Status After Fix:
IN_SERVICE

Additional Notes

Offsets improved from max 1.9 um to below 0.6 um across tested objectives.

📄 Raw YAML Ledger

View 2026-07-09_objective_turret_cleaning_and_recalibration.yaml

schema_version: 1
record_type: maintenance_event

maintenance_id: "maint_scope-testx1_20260709_objective_turret_cleaning_and_recalibration"
microscope: "scope-testx1"

service_provider: "internal"
company: "AIC Turku Microscopy Core"
contact: "Responsible staff: Elina Vainio"
reference: "INT-CORE-2026-411"

started_utc: "2026-07-09T10:15:00Z"
ended_utc: "2026-07-09T12:05:00Z"

reason: "check"
reason_details: >
  Weekly QC trend indicated slight channel-dependent focus offset after objective changes,
  suggesting turret contact contamination.

action: "clean"
action_details: >
  Cleaned turret electrical contacts and objective shoulders with approved solvent,
  then recalibrated parfocal offsets for 20x/40x/60x objectives.

microscope_status_after: "in_service"
downtime_hours: 1.8

related_qc:
  - "qc_scope-testx1_20260709T0930Z_focusoffset_v1"
  - "qc_scope-testx1_20260710T0730Z_focusoffset_v1"

attachments:
  - "maintenance/events/scope-testx1/2026/attachments/2026-07-09_parfocal_table.csv"

tags: ["objective", "turret", "cleaning", "calibration"]

followup: >
  Include objective switch stress-test in monthly QC set.
next_due_date: "2026-08-05"

notes: >
  Offsets improved from max 1.9 um to below 0.6 um across tested objectives.